The HR-E 40-1 passive near-field probe from Langer EMV-Technik measures electrical RF fields up to 40 GHz. Designed to be connected to a spectrum analyzer, oscilloscope, or similar device, the probe ...

Continuing increases in the speed of semiconductor devices combined with higher levels of integration, on-chip wireless functions, and the usage of mixed-signal-device designs are driving new ...

Demands for mission critical wireless services such as autonomous driving and telehealth require higher data transfer rates and lower latencies. Such applications are now driving the use of radio ...

October 9, 2014. Everett Charles Technologies (ECT) has launched the Z0 and Z1 probes—two new members of the ZIP probe family designed to meet signal-integrity challenges driven by the ever increasing ...

It’s a problem that has dogged electronic engineers since the first electrons were coaxed along a wire: that measuring instruments can themselves disrupt the operation of a circuit. Older multimeters ...

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...